---
name: afm-spm-analyzer-da2c6753f035
description: Atomic Force Microscopy and Scanning Probe Microscopy skill for nanoscale topography, mechanical, and electrical property mapping
allowed-tools:
  - Read
  - Write
  - Glob
  - Grep
  - Bash
metadata:
  specialization: nanotechnology
  domain: science
  category: microscopy-characterization
  priority: high
  phase: 6
  tools-libraries:
    - Gwyddion
    - WSxM
    - NanoScope Analysis
    - SPIP
graph:
  domains: [domain:nanotechnology]
  skillAreas: [skill-area:mathematical-reasoning, skill-area:physics-simulation, skill-area:data-analysis]
  workflows: [workflow:experiment-design]
  roles: [role:research-engineer]
---

# AFM-SPM Analyzer

## Purpose

The AFM-SPM Analyzer skill provides comprehensive atomic force and scanning probe microscopy data analysis for nanoscale surface characterization, including topography, mechanical properties, and electrical measurements.

## Capabilities

- Topography imaging and analysis
- Surface roughness calculation (Ra, RMS)
- Force-distance curve analysis
- Nanoindentation and mechanical mapping
- Kelvin probe force microscopy (KPFM)
- Conductive AFM measurements

## Usage Guidelines

### AFM Analysis Workflow

1. **Topography Analysis**
   - Apply plane leveling corrections
   - Remove artifacts and noise
   - Calculate roughness parameters

2. **Mechanical Mapping**
   - Calibrate cantilever spring constant
   - Apply contact mechanics models
   - Generate modulus maps

3. **Electrical Measurements**
   - Calibrate work function reference
   - Map surface potential
   - Measure local conductivity

## Process Integration

- Multi-Modal Nanomaterial Characterization Pipeline
- In-Situ Characterization Experiment Design
- Thin Film Deposition Process Optimization

## Input Schema

```json
{
  "data_file": "string",
  "analysis_type": "topography|force_curves|mechanical|electrical",
  "cantilever_specs": {
    "spring_constant": "number (N/m)",
    "tip_radius": "number (nm)"
  }
}
```

## Output Schema

```json
{
  "topography": {
    "Ra": "number (nm)",
    "RMS": "number (nm)",
    "Rmax": "number (nm)",
    "image_path": "string"
  },
  "mechanical": {
    "modulus": "number (GPa)",
    "adhesion": "number (nN)",
    "deformation": "number (nm)"
  },
  "electrical": {
    "surface_potential": "number (mV)",
    "work_function": "number (eV)"
  }
}
```


---
Source attribution: a5c-ai
Original project: https://github.com/a5c-ai/babysitter/blob/feb68abe397acc14f32b34984975c48fedba2b33/library/specializations/domains/science/nanotechnology/skills/afm-spm-analyzer/SKILL.md
License: MIT
License information: https://opensource.org/license/mit
Original upstream instructions; downloaded from Mega AI Hub.

## Upstream license notice

# MIT License

Copyright (c) 2025 A5C AI

Permission is hereby granted, free of charge, to any person obtaining a copy
of this software and associated documentation files (the "Software"), to deal
in the Software without restriction, including without limitation the rights
to use, copy, modify, merge, publish, distribute, sublicense, and/or sell
copies of the Software, and to permit persons to whom the Software is
furnished to do so, subject to the following conditions:

The above copyright notice and this permission notice shall be included in all
copies or substantial portions of the Software.

THE SOFTWARE IS PROVIDED "AS IS", WITHOUT WARRANTY OF ANY KIND, EXPRESS OR
IMPLIED, INCLUDING BUT NOT LIMITED TO THE WARRANTIES OF MERCHANTABILITY,
FITNESS FOR A PARTICULAR PURPOSE AND NONINFRINGEMENT. IN NO EVENT SHALL THE
AUTHORS OR COPYRIGHT HOLDERS BE LIABLE FOR ANY CLAIM, DAMAGES OR OTHER
LIABILITY, WHETHER IN AN ACTION OF CONTRACT, TORT OR OTHERWISE, ARISING FROM,
OUT OF OR IN CONNECTION WITH THE SOFTWARE OR THE USE OR OTHER DEALINGS IN THE
SOFTWARE.



# Mega AI Hub resource metadata

Creator / publisher: a5c-ai
Original project: https://github.com/a5c-ai/babysitter/blob/feb68abe397acc14f32b34984975c48fedba2b33/library/specializations/domains/science/nanotechnology/skills/afm-spm-analyzer/SKILL.md
Attribution basis: Source repository record

Fields of work: Education & Research
Roles: Researcher
Specialties: Specialty not specified
Tools: Gwyddion, Spip, Wsxm, Nanoscope Analysis
Country applicability: Country not specified
Classification basis: Source catalog labels
Instruction SHA-256: 7172fcede83d45525a72c2f5526e8fbf9d94ee39cc13853651915ec845066d58