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Additional file 1 of Deep learning image segmentation for the reliable porosity measurement of high-capacity Ni-based oxide cathode secondary particles

Additional file 1: Fig. S1. Effect of FFT and Gaussian filters for preparing input images. a Cross-sectional backscatter electron (BSE) SEM image of an NCM secondary particle as acquired without filtering. The vertical stripe-type contrast artifacts are formed due to the curtaining effect. b FFT filtered BSE SEM image to remove vertical stripe artifacts. c Prepared input image after removing statistical noise background by Gaussian filter for the FFT filtered image. Fig. S2. Application of the trained model to a different NCA secondary particle for detection and segmentation performance for irregular shape pores. This extra data supports that

Lee, Hee-Beom, Jung, Min-Hyoung, Kim, Young-Hoon, Park, Eun-Byeol, Jang, Woo-Sung, Kim, Seon-Je, Choi, Ki-ju, Park, Ji-young, Hwang, Kee-bum, Shim, Jae-Hyun, Yoon, Songhun, Kim, Young-Min
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