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X-ray Photoelectron Spectroscopy analysis skill for surface composition, chemical state, and depth profiling
---
name: xps-surface-analyzer-63fe10fdf934
description: X-ray Photoelectron Spectroscopy analysis skill for surface composition, chemical state, and depth profiling
allowed-tools:
- Read
- Write
- Glob
- Grep
- Bash
metadata:
specialization: nanotechnology
domain: science
category: surface-analysis
priority: high
phase: 6
tools-libraries:
- CasaXPS
- XPSPeak
- PHI MultiPak
- Avantage
graph:
domains: [domain:nanotechnology]
skillAreas: [skill-area:mathematical-reasoning, skill-area:physics-simulation, skill-area:data-analysis]
workflows: [workflow:experiment-design]
roles: [role:research-engineer]
---
# XPS Surface Analyzer
## Purpose
The XPS Surface Analyzer skill provides comprehensive X-ray Photoelectron Spectroscopy data analysis for nanomaterial surface characterization, enabling quantitative determination of surface composition, chemical states, and depth-dependent composition profiles.
## Capabilities
- Survey and high-resolution spectra acquisition
- Peak fitting and deconvolution
- Chemical state identification
- Quantitative surface composition
- Depth profiling analysis
- Charge correction and calibration
## Usage Guidelines
### XPS Analysis Workflow
1. **Survey Spectra**
- Identify all elements present
- Check for unexpected contamination
- Plan high-resolution scans
2. **Peak Fitting**
- Apply appropriate background (Shirley, Tougaard)
- Constrain FWHM within physical limits
- Assign chemical states from binding energy
3. **Quantification**
- Apply relative sensitivity factors
- Account for matrix effects
- Report with appropriate uncertainty
## Process Integration
- Multi-Modal Nanomaterial Characterization Pipeline
- Nanomaterial Surface Functionalization Pipeline
- Structure-Property Correlation Analysis
## Input Schema
```json
{
"sample_id": "string",
"elements_of_interest": ["string"],
"analysis_type": "survey|high_resolution|depth_profile",
"charge_reference": "C1s|Au4f|other"
}
```
## Output Schema
```json
{
"composition": [{
"element": "string",
"concentration": "number (at%)",
"uncertainty": "number"
}],
"chemical_states": [{
"element": "string",
"state": "string",
"binding_energy": "number (eV)",
"fraction": "number (%)"
}],
"depth_profile": {
"depths": ["number (nm)"],
"compositions": [{}]
}
}
```
---
name: xps-surface-analyzer-63fe10fdf934
description: X-ray Photoelectron Spectroscopy analysis skill for surface composition, chemical state, and depth profiling
allowed-tools:
- Read
- Write
- Glob
- Grep
- Bash
metadata:
specialization: nanotechnology
domain: science
category: surface-analysis
priority: high
phase: 6
tools-libraries:
- CasaXPS
- XPSPeak
- PHI MultiPak
- Avantage
graph:
domains: [domain:nanotechnology]
skillAreas: [skill-area:mathematical-reasoning, skill-area:physics-simulation, skill-area:data-analysis]
workflows: [workflow:experiment-design]
roles: [role:research-engineer]
---
# XPS Surface Analyzer
## Purpose
The XPS Surface Analyzer skill provides comprehensive X-ray Photoelectron Spectroscopy data analysis for nanomaterial surface characterization, enabling quantitative determination of surface composition, chemical states, and depth-dependent composition profiles.
## Capabilities
- Survey and high-resolution spectra acquisition
- Peak fitting and deconvolution
- Chemical state identification
- Quantitative surface composition
- Depth profiling analysis
- Charge correction and calibration
## Usage Guidelines
### XPS Analysis Workflow
1. **Survey Spectra**
- Identify all elements present
- Check for unexpected contamination
- Plan high-resolution scans
2. **Peak Fitting**
- Apply appropriate background (Shirley, Tougaard)
- Constrain FWHM within physical limits
- Assign chemical states from binding energy
3. **Quantification**
- Apply relative sensitivity factors
- Account for matrix effects
- Report with appropriate uncertainty
## Process Integration
- Multi-Modal Nanomaterial Characterization Pipeline
- Nanomaterial Surface Functionalization Pipeline
- Structure-Property Correlation Analysis
## Input Schema
```json
{
"sample_id": "string",
"elements_of_interest": ["string"],
"analysis_type": "survey|high_resolution|depth_profile",
"charge_reference": "C1s|Au4f|other"
}
```
## Output Schema
```json
{
"composition": [{
"element": "string",
"concentration": "number (at%)",
"uncertainty": "number"
}],
"chemical_states": [{
"element": "string",
"state": "string",
"binding_energy": "number (eV)",
"fraction": "number (%)"
}],
"depth_profile": {
"depths": ["number (nm)"],
"compositions": [{}]
}
}
```
Imported from the listed AgentSkill.sh category. Complete supplied package files and notices are retained. Required external tools and credentials are not installed. No bundled code was executed during import. Individual agent task behavior has not been tested.