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Atomic Force Microscopy and Scanning Probe Microscopy skill for nanoscale topography, mechanical, and electrical property mapping
---
name: afm-spm-analyzer-da2c6753f035
description: Atomic Force Microscopy and Scanning Probe Microscopy skill for nanoscale topography, mechanical, and electrical property mapping
allowed-tools:
- Read
- Write
- Glob
- Grep
- Bash
metadata:
specialization: nanotechnology
domain: science
category: microscopy-characterization
priority: high
phase: 6
tools-libraries:
- Gwyddion
- WSxM
- NanoScope Analysis
- SPIP
graph:
domains: [domain:nanotechnology]
skillAreas: [skill-area:mathematical-reasoning, skill-area:physics-simulation, skill-area:data-analysis]
workflows: [workflow:experiment-design]
roles: [role:research-engineer]
---
# AFM-SPM Analyzer
## Purpose
The AFM-SPM Analyzer skill provides comprehensive atomic force and scanning probe microscopy data analysis for nanoscale surface characterization, including topography, mechanical properties, and electrical measurements.
## Capabilities
- Topography imaging and analysis
- Surface roughness calculation (Ra, RMS)
- Force-distance curve analysis
- Nanoindentation and mechanical mapping
- Kelvin probe force microscopy (KPFM)
- Conductive AFM measurements
## Usage Guidelines
### AFM Analysis Workflow
1. **Topography Analysis**
- Apply plane leveling corrections
- Remove artifacts and noise
- Calculate roughness parameters
2. **Mechanical Mapping**
- Calibrate cantilever spring constant
- Apply contact mechanics models
- Generate modulus maps
3. **Electrical Measurements**
- Calibrate work function reference
- Map surface potential
- Measure local conductivity
## Process Integration
- Multi-Modal Nanomaterial Characterization Pipeline
- In-Situ Characterization Experiment Design
- Thin Film Deposition Process Optimization
## Input Schema
```json
{
"data_file": "string",
"analysis_type": "topography|force_curves|mechanical|electrical",
"cantilever_specs": {
"spring_constant": "number (N/m)",
"tip_radius": "number (nm)"
}
}
```
## Output Schema
```json
{
"topography": {
"Ra": "number (nm)",
"RMS": "number (nm)",
"Rmax": "number (nm)",
"image_path": "string"
},
"mechanical": {
"modulus": "number (GPa)",
"adhesion": "number (nN)",
"deformation": "number (nm)"
},
"electrical": {
"surface_potential": "number (mV)",
"work_function": "number (eV)"
}
}
```
---
name: afm-spm-analyzer-da2c6753f035
description: Atomic Force Microscopy and Scanning Probe Microscopy skill for nanoscale topography, mechanical, and electrical property mapping
allowed-tools:
- Read
- Write
- Glob
- Grep
- Bash
metadata:
specialization: nanotechnology
domain: science
category: microscopy-characterization
priority: high
phase: 6
tools-libraries:
- Gwyddion
- WSxM
- NanoScope Analysis
- SPIP
graph:
domains: [domain:nanotechnology]
skillAreas: [skill-area:mathematical-reasoning, skill-area:physics-simulation, skill-area:data-analysis]
workflows: [workflow:experiment-design]
roles: [role:research-engineer]
---
# AFM-SPM Analyzer
## Purpose
The AFM-SPM Analyzer skill provides comprehensive atomic force and scanning probe microscopy data analysis for nanoscale surface characterization, including topography, mechanical properties, and electrical measurements.
## Capabilities
- Topography imaging and analysis
- Surface roughness calculation (Ra, RMS)
- Force-distance curve analysis
- Nanoindentation and mechanical mapping
- Kelvin probe force microscopy (KPFM)
- Conductive AFM measurements
## Usage Guidelines
### AFM Analysis Workflow
1. **Topography Analysis**
- Apply plane leveling corrections
- Remove artifacts and noise
- Calculate roughness parameters
2. **Mechanical Mapping**
- Calibrate cantilever spring constant
- Apply contact mechanics models
- Generate modulus maps
3. **Electrical Measurements**
- Calibrate work function reference
- Map surface potential
- Measure local conductivity
## Process Integration
- Multi-Modal Nanomaterial Characterization Pipeline
- In-Situ Characterization Experiment Design
- Thin Film Deposition Process Optimization
## Input Schema
```json
{
"data_file": "string",
"analysis_type": "topography|force_curves|mechanical|electrical",
"cantilever_specs": {
"spring_constant": "number (N/m)",
"tip_radius": "number (nm)"
}
}
```
## Output Schema
```json
{
"topography": {
"Ra": "number (nm)",
"RMS": "number (nm)",
"Rmax": "number (nm)",
"image_path": "string"
},
"mechanical": {
"modulus": "number (GPa)",
"adhesion": "number (nN)",
"deformation": "number (nm)"
},
"electrical": {
"surface_potential": "number (mV)",
"work_function": "number (eV)"
}
}
```
Imported from the listed AgentSkill.sh category. Complete supplied package files and notices are retained. Required external tools and credentials are not installed. No bundled code was executed during import. Individual agent task behavior has not been tested.